{"id":9649948,"date":"2019-06-01T00:20:00","date_gmt":"2019-05-31T21:20:00","guid":{"rendered":"http:\/\/iee.it.teithe.gr\/course\/%ce%b7%ce%bb%ce%b5%ce%ba%cf%84%cf%81%ce%bf%ce%bd%ce%b9%ce%ba%ce%ac-%ce%ba%cf%85%ce%ba%ce%bb%cf%8e%ce%bc%ce%b1%cf%84%ce%b1\/"},"modified":"2025-02-09T23:28:20","modified_gmt":"2025-02-09T20:28:20","slug":"1404","status":"publish","type":"course","link":"https:\/\/www.iee.ihu.gr\/en\/course\/1404\/","title":{"rendered":"Electronic Circuits"},"content":{"rendered":"<p>The course includes the following topics:<\/p>\n<p><strong>Introduction:<\/strong> Symbolism on electronics, Voltage source\u2019s stiff region, Thevenin\u2019s and Norton\u2019s theorem.<\/p>\n<p><strong>Diode circuits:<\/strong> Diode physical structure, Ideal model, Load line and V-I characteristic, Diode circuits: clipper, clamper, peak detector, rectifier, regulators, Special purpose diodes, Zener diode.<\/p>\n<p><strong>Bipolar Junction Transistors (BJTs):<\/strong> BJT physical structure, Transistor currents, Load line and V-I characteristics, DC operating point, Saturation, Transistor Switch, Biasing circuits: voltage-divider bias, two-supply emitter bias, AC models, Transistor amplifiers: common emitter, common collector (emitter follower), common base, Two stage transistor amplifiers.<\/p>\n<p><strong>Junction Field Effect Transistor (JFETs):<\/strong> JFET physical structure, V-I characteristics, DC operation: ohmic and active regions, JFET analog Switch, JFET amplifiers.<\/p>\n<p><strong>Metal Oxide Semiconductor Field Effect Transistor (MOSFETs):<\/strong> MOSFET physical structure, V-I characteristics, DC operation: ohmic region, MOSFET digital Switch, CMOS.<\/p>","protected":false},"author":1,"template":"","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-9649948","course","type-course","status-publish","hentry"],"acf":[],"aioseo_notices":[],"post-meta-fields":{"course-semester":["4"],"_course-semester":["field_5d132f2c14d55"],"course-id":["1404"],"_course-id":["field_5d132b9c78b6e"],"course-group":[""],"_course-group":["field_5d14e905fe59a"],"course-type":["\u0395\u03a0"],"_course-type":["field_5d133c6ba1599"],"course-compulsory":["\u03a5\u03a0"],"_course-compulsory":["field_5d146d39805a6"],"course-field":["\u0397\u039b"],"_course-field":["field_5d146e248f2b3"],"course-ects":["6"],"_course-ects":["field_5d13518794761"],"course-hours-theory":["4"],"_course-hours-theory":["field_5d13521894762"],"course-hours-lab":[""],"_course-hours-lab":["field_5d1468d18a11f"],"_edit_lock":["1739132756:1"],"_edit_last":["1"],"course-school":["School of Engineering"],"_course-school":["field_5d132bf078b70"],"course-dept":["Department of Information and Electronic Engineering"],"_course-dept":["field_5d132c3a78b71"],"course-level":["1"],"_course-level":["field_5d132c5878b72"],"course-lang":["a:1:{i:0;s:2:\"el\";}"],"_course-lang":["field_5d133e246f04b"],"course-erasmus":["0"],"_course-erasmus":["field_5d133e8e6f04c"],"course-url":["https:\/\/exams-iee.the.ihu.gr\/course\/view.php?id=20"],"_course-url":["field_5d133f9b5c292"],"course-prerequisites":["a:1:{i:0;s:7:\"9649936\";}"],"_course-prerequisites":["field_5d13405189c17"],"course-aim":["The main objectives of the course are: (i) to comprehend the operation of the basic electronic devices, (ii) to develop the ability to analyse and design basic discrete analogue electronic circuits."],"_course-aim":["field_5d1353f985af8"],"course-goal-1":["Recognizes, analyzes and designs how voltage sources and their signals are adapted to the various stages of an electronic circuit and breaks down the basic diode circuits."],"_course-goal-1":["field_5d13546e85af9"],"course-goal-2":["Recognizes the physical structure, distinguishes the operating areas and designs and evaluates the characteristic voltage-current curves of the bipolar junction transistor (BJT), draws the load line and explains and defines the operating point of the BJT, calculates the BJT DC analysis and evaluate its switching function."],"_course-goal-2":["field_5d1354f885afa"],"course-goal-3":["Recognizes, calculates and compares BJT polarization modes, recognizes and combines the use of BJT equivalent \u03c0 and T models."],"_course-goal-3":["field_5d13550085afb"],"course-goal-4":["Distinguishes the category of the circuit and calculates and judges the key sizes in BJT amplifier operation."],"_course-goal-4":["field_5d13550e85afc"],"course-goal-5":["Designs BJT common emitter amplifier circuits."],"_course-goal-5":["field_5d13551485afd"],"course-goal-6":["Recognizes the physical structure, distinguishes the operating areas and designs and evaluates the characteristic voltage-current curves of the field-effect transistor (JFET), calculates the JFET DC current analysis, and evaluates its switching function and calculates and calculates judges the key sizes in JFET boost operation."],"_course-goal-6":["field_5d13551b85afe"],"course-goal-7":["Recognizes the physical structure, distinguishes operating areas, and designs and evaluates the characteristic voltage-current curves of the semiconductor metal field effect transistor (MOSFET), calculates the MOSFET DC current analysis, and evaluates its switching function and judge the interrupt function of the basic CMOS inverter."],"_course-goal-7":["field_5d13552385aff"],"course-skills":["Search, analyze and synthesize data and information, using the necessary technologies.\r\nDecision making.\r\nIndependent work.\r\nTeamwork.\r\nExercising criticism and self-criticism.\r\nPromoting free, creative and inductive thinking."],"_course-skills":["field_5d1355c25aeb4"],"course-teaching-method":["The course is developed in lectures and simulation exercises in parallel. The simulation includes experiments with electronic components circuitry development over breadboard. Oscilloscope, signal generator and power supply are used. The simulation exercises (experiments) cover the following topics: BJT\u2019s V-I characteristics, Transistor Switch, Transistor amplifiers: common emitter, common collector (emitter follower), common base."],"_course-teaching-method":["field_5d1383ec75a23"],"course-it-methods":["Face to face teaching\r\nNotes and slides available in electronic form\r\nUse of asynchronous learning platform (Moodle)"],"_course-it-methods":["field_5d1384b975a24"],"course-activity-1":["Lectures"],"_course-activity-1":["field_5d1387d7cba43"],"course-activity-workload-1":["52"],"_course-activity-workload-1":["field_5d1388b2cba46"],"course-activity-2":["Problem solving"],"_course-activity-2":["field_5d13886ccba44"],"course-activity-workload-2":["28"],"_course-activity-workload-2":["field_5d1388e9cba47"],"course-activity-3":["Circuit analysis using simulation software"],"_course-activity-3":["field_5d138878cba45"],"course-activity-workload-3":["20"],"_course-activity-workload-3":["field_5d13890dcba49"],"course-activity-4":["Individual study and analysis of literature"],"_course-activity-4":["field_5d138947cba4b"],"course-activity-workload-4":["80"],"_course-activity-workload-4":["field_5d13891dcba4a"],"course-activity-5":[""],"_course-activity-5":["field_5d14ed2508982"],"course-activity-workload-5":[""],"_course-activity-workload-5":["field_5d14ed3708983"],"course-student-evaluation":["Evaluation is based on: (i) the final written exams in theory, (ii) simulation tasks evaluation and partial written exams in simulation exercises. Also, projects are available on per request basis which are accumulated over the final grade."],"_course-student-evaluation":["field_5d1389cff8c01"],"course-eudoxus-bib":["Malvino A., Bates D., \"Electronic Principles\", McGraw-Hill Ed."],"_course-eudoxus-bib":["field_5d138e0af441c"],"course-greek-bib":["Milman J., Grabel A., \"\u039c\u03b9\u03ba\u03c1\u03bf\u03b7\u03bb\u03b5\u03ba\u03c4\u03c1\u03bf\u03bd\u03b9\u03ba\u03ae\", \u0395\u03ba\u03b4. \u0391. \u03a4\u03b6\u03b9\u03cc\u03bb\u03b1 &amp; \u03a5\u03b9\u03bf\u03af , \u0388\u03ba\u03b4\u03bf\u03c3\u03b7 2\u03b7, 2014, ISBN: 978-960-418-424-8, \u039a\u03c9\u03b4. \u0395\u03c5\u03b4\u03cc\u03be\u03bf\u03c5 32997429."],"_course-greek-bib":["field_5d138e3cf441d"],"course-intl-bib":["Bobrow, Funtamentals of Electrical Engineering, Oxford University Press.\r\nHambley, Electronics, Prentice Hall."],"_course-intl-bib":["field_5d138e74f441e"],"course-rel-journals":["IEEE Transactions on Circuits and Systems\r\nIEEE Transactions on Instrumentation and Measurement"],"_course-rel-journals":["field_5d138ec4f441f"],"course-teachers":["a:2:{i:0;s:7:\"9651008\";i:1;s:7:\"9651024\";}"],"_course-teachers":["field_5d3aa2923f803"],"_wp_old_slug":["%ce%b7%ce%bb%ce%b5%ce%ba%cf%84%cf%81%ce%bf%ce%bd%ce%b9%ce%ba%ce%ac-%ce%ba%cf%85%ce%ba%ce%bb%cf%8e%ce%bc%ce%b1%cf%84%ce%b1"],"course-coordinator":["a:1:{i:0;s:7:\"9651024\";}"],"_course-coordinator":["field_5faa4466f1b87"],"_aioseo_title":[null],"_aioseo_description":[null],"_aioseo_keywords":["a:0:{}"],"_aioseo_og_title":[null],"_aioseo_og_description":[null],"_aioseo_og_article_section":[""],"_aioseo_og_article_tags":["a:0:{}"],"_aioseo_twitter_title":[null],"_aioseo_twitter_description":[null]},"_links":{"self":[{"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/course\/9649948","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/course"}],"about":[{"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/types\/course"}],"author":[{"embeddable":true,"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/users\/1"}],"version-history":[{"count":2,"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/course\/9649948\/revisions"}],"predecessor-version":[{"id":9673175,"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/course\/9649948\/revisions\/9673175"}],"wp:attachment":[{"href":"https:\/\/www.iee.ihu.gr\/en\/wp-json\/wp\/v2\/media?parent=9649948"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}